扫描探针声学显微技术研究进展
周锡龙,李法新,付际
1. 武汉理工大学理学院工程结构与力学系
2. 北京大学
3.
Research Progress in Atomic Force Acoustic Microscopy
摘要 纳米科技的快速发展迫切需要对材料小尺度下的力学性能进行定量化测试与表征。将声学和原子力显微镜相结合的扫描探针声学显微技术(Atomic Force Acoustic Microscopy,AFAM)是近年来发展的一项定量化纳米力学测试方法,具有高分辨和无损的优势。本文围绕AFAM这一测试技术,首先详细论述了AFAM弹性力学性能和粘弹性力学性能定量化测试的基本原理以及两种成像模式;随后对AFAM方法研究相关的进展进行了分析归纳;接着对AFAM在纤维增强复合材料、智能材料、生物材料、纳米材料和薄膜中的应用进展进行了综述;最后对AFAM进行总结和展望。
Abstract :
With the rapid development and wide applications of nano-science and nano-technology, there is an urgent need for nanoscale
quantitative mechanical property measurements asic physical concepts and principles for both quantitative elastic and viscoelastic property measurements are discussed in details. The two theoretical mechanical models for quantification process are recapitulated, which are the cantilever vibration model and the contact mechanics model between the tip and the sample. Next, the fixed frequency excitation mode for qualitative imaging and the resonance tracking mode for quantitative imaging of AFAM are explained. Then, the development of AFAM method is reviewed, including the development of basic quantitative measurement theory, the study on the accuracy and sensitivity of AFAM, the development of new measurement modes, and the new hardware and software upgrades, etc. The advances in the applications of AFAM method to nanomechanical measurement and characterization are given afterwards. The wide applications of AFAM mainly involve the nanomechanical characterization of fiber reinforced composites and their interfaces, the microstructure characterization of smart materials due to mechanical heterogeneity at the microscale, the nanomechanical measurements of bio-materials as well as their interfaces, and the characterization of nanomaterials and thin film systems (e.g., nanocrystalline materials, nanowires, subsurface imaging, etc.). The summary and prospect are finally given to show the problems and future work of AFAM. This review provides a general description of the state of the art, and aims to make researchers achieve a better understanding on the implementation of their own AFAM measurements and extend the applications of AFAM to the nanoscale mechanical characterization of various natural and artificial materials. and characterization. Combining acoustics and atomic force microscopy together, the atomic force acoustic microscopy (AFAM) provides a promising technique for quantitative, high resolution and non-destructive mechanical property characterization of materials on a nanoscale. This paper focuses on the research progress in the AFAM measurement method and its wide applications in various fields. First, the b
收稿日期: 2015-12-18
出版日期: 2016-04-14
基金资助: 基于扫描探针显微术的铁电材料纳米尺度多场耦合效应研究
通讯作者:
周锡龙
E-mail: xlzhou@whut.edu.cn
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