Abstract：High-throughput atomic force microscopy (HT-AFM) aims to address the challenges of low throughput in traditional AFM, which struggles to characterize material heterogeneity and dynamic processes. This perspective reviews recent technical advances involving high-speed scanning hardware, innovative imaging modes, and artificial intelligence algorithms, and analyzes the challenges in balancing speed, accuracy, and resolution, processing vast amounts of data, and developing functionalized probes. The future trend towards intelligent and multi-modal integration is also discussed, highlighting the potential evolution of this methodology from an observational tool into an analytical engine.
2026, Vol. 47 
