Abstract:The High residual compressive stress in thin film-substrate systems usually causes structural and functional failures via buckling instability. Surface instability, evolution and pattern formation in buckled films have become hot topics in the field of nonlinear mechanics. Such buckling instabilities depend on not only the mechanical properties of both the film and the substrate but also the interfacial properties between them, exhibiting multiple modes such as wrinkling, buckle-delamination, crease, etc. This paper briefly reviews the formation conditions of these buckling modes, their influencing factors and post-buckling morphologies. The first part focuses on the formations of one-dimensional wrinkling, wrinkle branching, anisotropic wrinkles, localized wrinkles and wrinkles on curved substrates. The second part introduces the formation and growth of one-dimensional buckle-delamination, telephone-cord buckles, and network-like blisters. The effects of substrate curvature, interface sliding and ridge cracking are also discussed. The final part introduces the formation mechanism and critical conditions of other advanced buckling modes such as crease, folding and ridge.