MENG LiFei,
PAN ZongHao,
YI Zhong et al
.2018.Error properties of the fluxgate magnetometer offset based on Davis-Smith method Chinese Journal of Geophysics(in Chinese),61(9): 3545-3551,doi: 10.6038/cjg2018L0264
Error properties of the fluxgate magnetometer offset based on Davis-Smith method
MENG LiFei1, PAN ZongHao2, YI Zhong1, WANG GuoQiang3, ZHANG TieLong3,4
1. Beijing Institute of Spacecraft Environment Engineering, Beijing 100029, China; 2. Key Laboratory of Geospace Environment, School of Earth and Space Sciences, University of Science and Technology of China, Hefei 230026, China; 3. Institute of Space Science and Applied Technology, Harbin Institute of Technology (Shenzhen), Shenzhen 518055, China; 4. Space Research Institute, Austrian Academy of Sciences, A-8042 Graz, Austria
Abstract：There is a zero level drift for the fluxgate magnetometer carried by a satellite over time, so the magnetometer needs to be compensated. Based on the characteristics of the Alfvén fluctuation of the interplanetary magnetic field, the Davis-Smith method can be used to calculate the zero level of the magnetometer. In this paper, we use the numerical simulation to analyze the error characteristics of the zero level, which calculated by the Davis-Smith method, caused by the total magnetic field amplitude BT and the compressional fluctuation. We find that the larger the BT is, the greater the error of the zero level is. When there is a difference of the frequencies between the compressional and Alfvén fluctuations, the ratio between the zero level offsets of any two components of the magnetic field is approximately equal to the ratio of the corresponding background magnetic field. The error of the zero level tends to be smaller when the amplitude of the compressional fluctuation is smaller. In addition, the frequency and initial phase of the compressional fluctuation can also affect the error of the zero level. These error characteristics can provide important theoretical basis for improving the reliability of the zero level offset.
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